Author: Vijayram Gopu
Publication Overview
Publication period start: 2004
Number of co-authors: 2
Co-Authors
Number of publications with favourite co-authors
Productive Colleagues
Most productive colleagues in number of publications
Publications
Schroeder,
Patrick J.,
Bolaki,
Pankaj,
Gopu,
Vijayram
(2004):
Comparing the Fault Detection Effectiveness of N-way and Random Test Suites.
In:
ISESE 2004 - International Symposium on Empirical Software Engineering
19-20 August,
2004,
Redondo Beach, CA, USA.
pp. 49-59.
https://doi.ieeecomputersociety.org/10.1109/ISESE.2004.16