Author: Thomas W. Williams
Publication Overview
Publication period start: 1984
Number of co-authors: 4
Co-Authors
Number of publications with favourite co-authors
Productive Colleagues
Most productive colleagues in number of publications
Publications
Samaranayake,
Samitha,
Sitchinava,
Nodari,
Kapur,
Rohit,
Amin,
Minesh B.,
Williams,
Thomas W.
(2002):
Dynamic Scan: Driving Down the Cost of Test.
In
IEEE Computer,
35
(10)
pp. 63-68.
https://csdl.computer.org/comp/mags/co/2002/10/rx063abs.htm
Kapur,
Rohit,
Williams,
Thomas W.
(1999):
Tough Challenges as Design and Test Go Nanometer - Guest Editors\' Introduction.
In
IEEE Computer,
32
(11)
pp. 42-45.
Williams,
Thomas W.
(1984):
VLSI Testing.
In
IEEE Computer,
17
(10)
pp. 126-136.