Author: Kendra N. Schmid
Publication Overview
Publication period start: 2005
Number of co-authors: 3
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Publications
Wasson,
Kimberly S.,
Schmid,
Kendra N.,
Lutz,
Robyn R.,
Knight,
John C.
(2005):
Using Occurrence Properties of Defect Report Data to Improve Requirements.
In:
13th IEEE International Conference on Requirements Engineering RE 2005
29 August - 2 September,
2005,
Paris, France.
pp. 253-262.
https://doi.ieeecomputersociety.org/10.1109/RE.2005.77