Author: John P. Hayes
Publication Overview
Publication period start: 1996
Number of co-authors: 2
Co-Authors
Number of publications with favourite co-authors
Productive Colleagues
Most productive colleagues in number of publications
Publications
Murray,
Brian T.,
Hayes,
John P.
(1996):
Testing ICs: Getting to the Core of the Problem.
In
IEEE Computer,
29
(11)
pp. 32-38.
Bhattacharya,
Debashis,
Murray,
Brian T.,
Hayes,
John P.
(1989):
High-Level Test Generation for VLSI.
In
IEEE Computer,
22
(4)
pp. 16-24.