Author: John Lynch
Publication Overview
Publication period start: 2000
Number of co-authors: 3
Co-Authors
Number of publications with favourite co-authors
Productive Colleagues
Most productive colleagues in number of publications
Publications
Agarwal,
Ritu,
Prasad,
Jayesh,
Tanniru,
Mohan,
Lynch,
John
(2000):
Risks of rapid application development.
In
Communications of the ACM,
43
(11)
pp. 1.
https://dl.acm.org/doi/10.1145/352515.352516