Author: David L. Elwood
Publication Overview
Publication period start: 1972
Publications
Elwood,
David L.
(1972):
Test Retest Reliability and Cost Analyses of Automated and Face to Face Intelligence Testi.
In
International Journal of Man-Machine Studies,
4
(1)
pp. 1-22.
Elwood,
David L.
(1972):
Automated WAIS Testing Correlated with Face-to-Face WAIS Testing: A Validity Study.
In
International Journal of Man-Machine Studies,
4
(2)
pp. 129-137.
Elwood,
David L.
(1972):
Automated versus Face-to-Face Intelligence Testing: Comparison of Test-Retest Reliabilitie.
In
International Journal of Man-Machine Studies,
4
(3)
pp. 363-369.